Description

Nanoparticles are essential constituents of nanotechnological devices. Transmission electron microscopes (TEMs) are used in their characterization because of the high spatial resolution. Recently, the development of the so-called four-dimensional scanning-TEM (4D-STEM) has raised interest in electron diffraction (ED). We aim to explore the whole potential provided by Precession Electron Diffraction-PED and new Direct Electron Detectors for the characterization of nanoparticles by strain measurement, PED-based Pair Distribution Function (PED-PDF) and Automatic Cystal orientation Mapping (ACOM).

Requirements

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Mandatory requirements: 

PhD in Physics, Chemistry, Engineering or Materials Science. 

Previous experience in the study of nanosystems by TEM.

Desirable requirements

Previous experience in the following crystallographic techniques: a) Precession electron diffraction (PED) or b) Pair Distribution Function (PDF).

How to apply

Send by email:

a) CV,

 b) Two recommendation letters sent directly to the email by the person signing the letter;

c) Motivation letter.